The primary focus of my research is to design and fabricate Atomic Force Microscope probes that operate at high AC frequencies. The fabrication of this custom probe will enable gigahertz excitation and measurements of nanometer-sized devices. Further, this would allow for the characterization of magnetic tunnel junctions, and possibly phase change devices, both of which are currently being investigated here at Carnegie Mellon University.
Publications with Ricketts Lab
Williams, D.F.; Corson, P.; Sharma, J.; Krishnaswamy, H.; Tai, W.; George, Z.; Ricketts, D.S.; Watson, P.M.; Dacquay, E.; Voinigescu, S.P., “Calibrations for Millimeter-Wave Silicon Transistor Characterization,” Microwave Theory and Techniques, IEEE Transactions on , vol.62, no.3, pp.658-668, Mar. 2014.
Williams, D.F.; Corson, P.; Sharma, J.; Krishnaswamy, H.; Wei Tai; George, Z.; Ricketts, D.; Watson, P.; Dacquay, E.; Voinigescu, S.P., “Calibration-Kit Design for Millimeter-Wave Silicon Integrated Circuits,” Microwave Theory and Techniques, IEEE Transactions on , vol.61, no.7, pp.2685-2694, July 2013.
W. Hu, J. Gu, Z. George and D. S. Ricketts, “Directed scanning probe nanomanufacturing of lateral Ti-TiO2-Ti junctions for low capacitance MIM rectenna diodes,” Micro and Nano Engineering Conf., Berlin, Sept. 2011.