Dr. Weihua Hu

Weihua Hu

Dr. Wei Tai

Ph.D. 2012

Ph.D Carnegie Mellon Univ.

hu_works

Research Description

My research belongs to the project of Tip-directed Field-emission Assisted Nanofabrication (TFAN). Based on Zuber’s field emission model, I try to adjust nanofabricated feature size by controlling emission current beam.

Publications with Ricketts Lab

Journals

Ozcan, O.; Weihua Hu; Sitti, M.; Bain, J.; Ricketts, D.S.,Investigation of tip current and normal force measured simultaneously during local oxidation of titanium using dual-mode scanning probe microscopy,” Micro & Nano Letters, IET , vol.9, no.5, pp.332-336, May 2014.

W. Hu, J. A. Bain and D. S. Ricketts “In-Situ quantification of electrical isolation in STM-fabricated TiOx nanostructures,” Micro and Nano Letters, vol. 7, no. 4, pp. 334-36, Apr. 2012.

Conferences

O. Ozcan, W. Hu, M. Sitti, J. A. Bain and D.S. Ricketts, “Experimental Investigation of Force, Conduction and Growth in Nano-oxidation using scanning probe microscopy,” Enabling Nanomanufacturing for Rapid Innovation, Aug. 2013. [Best Poster]

W. Hu J. A. Bain and D. S. Ricketts, “In-situ characterization using AFM probes in multiple modes,” Int. Conf. Electron, Ion, Photon Beam Technology and Nanofabrication, May, 2012.

W. Hu, J. Gu, Z. George and D. S. Ricketts, “Directed scanning probe nanomanufacturing of lateral Ti-TiO2-Ti junctions for low capacitance MIM rectenna diodes,” Micro and Nano Engineering Conf., Berlin, Sept. 2011.

W. Hu, Y. Tang, Y.Zhang, J. Gu, S. Tamaru, J. A. Bain, L. R. Carley, R. F. Davis, G. K. Fedder and D. S. Ricketts, “TI/TIO2 nanodevice fabrication using compliant probes and CMOS probe-arrays,” Technologies for Future Micro-Nano Manufacturing, Napa Valley, CA, Aug. 2011.

W. Hu, S. Tamaru, J. A. Bain and D. S. Ricketts, “High Current Pulse Generation for Thermal Surface Modification using Standard STM,” Int. Conf. Electron, Ion, Photon Beam Technology and Nanofabrication, May. 2011.

J. R. Smith, W. Hu, Y-Y Dang, O. Ozcan, M. Sitti, J. A. Bain, D. S. Ricketts, R. Davis, “Scanning Probe Nanomanufacturing on Si: Surface Characterization of the Process Technique,” Materials Research Symposium, paper G1.5, Nov. 2010

J.R. Smith, W. Hu, Y.Y. Dang, O. Ozcan, M. Sitti, J. Bain, R. Davis and D. S. Ricketts, “Writing Si nanowires on Si (100) with an STM tip: surface preparation and initial results,” Materials Research Symposium, M11.50, Boston, MA, Nov. 2009